ZDIMMs (Zefr Memory Module) are rigorously tested to eliminate over 90% of memory reliability failures, ensuring maximum application uptime and optimizing memory subsystem reliability.
ZDIMMs utilize SMART’s Zefr™ proprietary screening process, ensuring the industry’s highest levels of uptime and reliability.
ZDIMMs are targeted for data centers, high-performance computing (HPC) platforms, and other computing environments running large memory applications that demand high reliability.
| SRZ8197RD440425-SC | 64GB | C-temp (0˚C to +70˚C) |
| STB4097RD420425-SE | 32GB | C-temp (0˚C to +70˚C) |
| STB4097RD420425-MR | 32GB | C-temp (0˚C to +70˚C) |
| SRZ4097RD440425-SC | 32GB | C-temp (0˚C to +70˚C) |
| SRZ4097RD420825-SC | 32GB | C-temp (0˚C to +70˚C) |
| SRZ2047RD410825-SE | 16GB | C-temp (0˚C to +70˚C) |
| STB2047RD420425-SE | 16GB | C-temp (0˚C to +70˚C) |
| M-WP016 SMART Zefr Penguin Computing Use Case_White Paper | 02/05/2025 |
| M-WP015 Zefr High Reliability Memory_White Paper | 10/11/2024 |
| SMART ZDIMMs for AI and ML | 12/13/2024 |
| SMART Zefr ZDIMM Brochure_2024 | 12/13/2024 |